UNAM 4-Layer BEOL (Y1)
SIDRA's heart at the UNAM workshop — HfO₂ memristor production.
Prerequisites
What you'll learn here
- Map the UNAM workshop's 4-layer BEOL flow
- Identify the HfO₂ ALD reactor and its workflow
- Sequence DUV lithography + ICP-RIE etch + CMP + PVD Cu stages
- State time, equipment, personnel needs per stage
- Identify investment for UNAM capacity growth
Hook: UNAM = SIDRA's Silicon Lab
UNAM (National Nanotechnology Research Center, Bilkent): Türkiye’s main nanotechnology center. The physical home of the SIDRA workshop.
Task: add HfO₂ memristor BEOL to bare-CMOS wafers from TSMC.
3 weeks, 4 main layers (HfO₂ + M3 + M4 + pad). This chapter goes deep.
Intuition: 4 Layers + 3 Weeks
Week 5 (wafer arrives from TSMC):
Day 1: Intake test + clean.
Day 2-3: HfO₂ ALD (active memristor).
Week 6:
Day 4-5: DUV lithography (memristor pattern).
Day 6: ICP-RIE etch (remove unwanted HfO₂).
Day 7: CMP planarization.
Week 7:
Day 8-9: M3 PVD Cu + litho + etch.
Day 10-11: M4 PVD Cu + litho + etch.
Day 12: Pad opening + final testing.After 3 weeks, a complete SIDRA Y1 wafer.
Formalism: Per-Stage Detail
HfO₂ ALD (Atomic Layer Deposition):
ALD reactor:
- Precursor: Tetrakis(dimethylamino)hafnium (TDMAHf) + H₂O.
- Temperature: 300°C.
- Cycle: 1 Å/cycle.
- 5 nm HfO₂ = 50 cycles × 5 s = 4 min active + 2-hour setup.
Uniformity: ±1% across the wafer. Critical for yield.
Y1 UNAM: 2 ALD reactors in parallel. Daily 2 wafers.
DUV lithography (193 nm):
Stepper (1 reticule at a time):
- Resist coat: 100 nm.
- Expose: 193 nm UV.
- Develop: NaOH solution.
- Hard bake.
Time: 1 hour/wafer (resist + expose + develop).
Stepper at Y1: used ASML 193 nm ~$5M.
ICP-RIE etch:
Plasma etch of HfO₂ with BCl₃ + Ar:
- Etch rate: 30 nm/min.
- Selectivity (photoresist): S ~30.
- 5 nm HfO₂: 10 s (+ pattern transfer).
Result: patterned HfO₂ layer (memristor-shaped).
CMP (Chemical Mechanical Planarization):
Wafer planarization:
- Slurry: silica + H₂O₂.
- Pad: polyurethane.
- Pressure + rotation 2 min.
Mandatory after every metal layer (for a flat surface for the next).
M3 PVD Cu + lithography:
M3 = bit-line metal (crossbar columns):
- PVD sputter Cu: 50 nm.
- Thin TaN barrier.
- Resist + DUV stepper.
- Etch.
- CMP.
Each metal layer ~1 day.
M4 PVD Cu:
M4 = word-line (rows). Same as M3, perpendicular direction.
M3 and M4 intersections at the HfO₂ cell = crossbar.
Pad opening:
Final step: pad openings to the outside world.
- Al pad (bond-wire compatible) or Cu.
- Passivation (SiN protection).
- Pad opening.
Wafer output:
Per wafer = 38 dies × SIDRA Y1. Active memristor layer + 3 metals + pad. TSMC substrate + UNAM BEOL complete.
Equipment cost:
| Equipment | Y1 UNAM | Y10 mini-fab |
|---|---|---|
| ALD reactor | 2 × $500K | 8 × $500K |
| DUV stepper | 1 × $5M (used) | 2 × $15M (new) |
| ICP-RIE | 1 × $300K | 4 × $500K |
| CMP | 1 × $200K | 4 × $400K |
| PVD sputter | 1 × $400K | 4 × $600K |
| Test + metrology | 1 × $500K | 2 × $2M |
| Total equipment | ~$7M | ~$50M |
Personnel:
| Role | Y1 UNAM | Y10 mini-fab |
|---|---|---|
| Process engineer | 5 | 20 |
| Equipment engineer | 3 | 15 |
| Technician | 5 | 40 |
| Test | 2 | 10 |
| Management | 2 | 10 |
| Total | 17 | 95 |
UNAM university environment → PhD students also contribute (education + production).
Yield control:
After each layer:
- Optical inspection (OTP): particles, defects.
- Electrical test (4-probe): conductance.
- Error → layer reprocess (rework).
Typical rework rate: 10% (first-pass 90% success).
Chemical safety:
BCl₃ (toxic gas) → special scrubber. NaOH (caustic) → PPE. Cu slurry → wastewater management.
UNAM infrastructure (Bilkent) provides these. ~$500K extra.
Maintenance schedule:
- Daily: cleanup, calibration.
- Weekly: precursor change.
- Monthly: vacuum pump.
- Yearly: major maintenance (chamber replace).
Typical equipment downtime ~5%. Doesn’t disturb 250 wafers/year capacity.
Y10 mini-fab scale-up:
4× ALD, 2× stepper, 4× others → 10× capacity. 2500 wafers/year.
Cost: 20M building. Opex $10M/year (100 personnel).
ROI: 1M chips/year × 150M/year revenue. 5-year payback.
UNAM’s role:
- Y1: full workshop at Bilkent.
- Y3: UNAM 2× capacity.
- Y10: mini-fab in Ankara (TÜBİTAK/ASELSAN partnership).
- Y100: full fab (industrial zone).
UNAM stays as research + pilot. Production shifts to mini-fab.
Experiment: One UNAM Week
Week 5 (5 new wafers from TSMC):
Monday:
- Morning: intake inspection (5 wafers).
- Afternoon: ALD reactor #1 setup.
Tuesday:
- ALD reactor #1: wafers 1+2 HfO₂ deposition (4 hours each).
- Afternoon: ALD reactor #2 setup, wafers 3+4 begin.
Wednesday:
- ALD wafer 5 (reactor #1).
- Other 4 wafers resist coat for DUV stepper.
Thursday:
- DUV stepper: 5 wafers in sequence (1 hour each).
Friday:
- ICP-RIE etch 5 wafers (10 min each + 20 min chamber prep).
- CMP queue.
- Weekend: reactor maintenance.
Output: 5 wafers completed HfO₂ stage. Next 2 weeks M3-M4-pad.
Quick Quiz
Lab Exercise
UNAM workshop expansion plan.
Scenario: in 2027, the Y1 100K/year target requires 16× workshop growth.
Strategies:
(a) Expand existing UNAM floor: $5M additional ALD + DUV. 2× capacity.
(b) New UNAM branch in Istanbul: $10M new workshop. 8× UNAM capacity.
(c) Mini-fab in Ankara: $70M. 20× UNAM capacity (already Y10 target).
(d) Hybrid: UNAM 2× + mini-fab 10×. $80M total.
Pick: (d) recommended. UNAM kept for research + pilot; production shifts to mini-fab. Gradual transition.
Cheat Sheet
- UNAM: Bilkent, SIDRA workshop.
- BEOL 4 layers: HfO₂ + M3 + M4 + pad.
- Time: 3 weeks/wafer.
- Weekly: 5 wafers/UNAM.
- Annual: 250 wafers = 7K chips.
- Equipment: ~$7M.
- Y10 mini-fab target: 20× capacity, $70M.
Vision: From UNAM to a Fab
- Y1: UNAM workshop.
- Y3: UNAM + small satellite (Istanbul).
- Y10: Ankara mini-fab.
- Y100: Full fab in an industrial zone.
- Y1000: Multi-fab Türkiye network.
Further Reading
- Next chapter: 7.5 — METU CMP Collaboration
- Previous: 7.3 — TSMC 28nm MPW
- UNAM: unam.bilkent.edu.tr.
- Workshop management: classical industry standards.